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Microscopía electrónica de barrido

Scanning electron microscopy is a characterization technique that images and analyzes a specimen by scanning an accelerated electron beam, followed by selectively collecting and recording secondary electrons, back-scattered electrons, and other signals arising from the beam and specimen interactions.

Microscopia de barrido

francés

Creado

2023-04-28T10:40:00

void:inDataset

http://aims.fao.org/aos/agrovoc/void.ttl#Agrovoc

skos:notation

a87b3af2

microscopie électronique à balayage

inglés

Creado

2023-04-27T10:07:47

void:inDataset

http://aims.fao.org/aos/agrovoc/void.ttl#Agrovoc

skos:notation

a87b3af2

scanning electron microscopy

URI

http://aims.fao.org/aos/agrovoc/c_a87b3af2

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Creado 4/27/23, 10:07, última modificación 9/8/25, 04:04