NALT

Preferred term

atomic force microscopy

Topic

A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample.

scanning probe microscopy

magnetic force microscopy
piezoresponse force microscopy
scanning force microscopy

Field 001 in MARC Authority Format

60425

Spanish

microscopia de fuerza atómica

URI

https://lod.nal.usda.gov/nalt/188543

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Created 7/10/12, last modified 10/5/20