@prefix agrovoc: <http://aims.fao.org/aos/agrovoc/> .
@prefix rdf: <http://www.w3.org/1999/02/22-rdf-syntax-ns#> .
@prefix ns0: <http://art.uniroma2.it/ontologies/vocbench#> .
@prefix dc: <http://purl.org/dc/terms/> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .
@prefix skosxl: <http://www.w3.org/2008/05/skos-xl#> .
@prefix void: <http://rdfs.org/ns/void#> .
@prefix skos: <http://www.w3.org/2004/02/skos/core#> .
@prefix owl: <http://www.w3.org/2002/07/owl#> .
@prefix rdfs: <http://www.w3.org/2000/01/rdf-schema#> .

agrovoc:xDef_a74fa002
  rdf:value "Scanning electron microscopy is a characterization technique that images and analyzes a specimen by scanning an accelerated electron beam, followed by selectively collecting and recording secondary electrons, back-scattered electrons, and other signals arising from the beam and specimen interactions."@en ;
  ns0:hasSource "Ni C. (2013) Scanning Electron Microscopy (SEM). In: Wang Q.J., Chung YW. (eds) Encyclopedia of Tribology. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-92897-5_1217" ;
  dc:created "2023-04-27T10:10:01"^^xsd:dateTime .

agrovoc:xl_fr_88b46128
  a skosxl:Label ;
  dc:created "2023-04-28T10:40:00"^^xsd:dateTime ;
  void:inDataset <http://aims.fao.org/aos/agrovoc/void.ttl#Agrovoc> ;
  skos:notation "a87b3af2"^^agrovoc:AgrovocCode ;
  skosxl:literalForm "microscopie électronique à balayage"@fr .

agrovoc:xl_es_c86b7a10
  a skosxl:Label ;
  dc:created "2023-04-28T10:40:00"^^xsd:dateTime ;
  void:inDataset <http://aims.fao.org/aos/agrovoc/void.ttl#Agrovoc> ;
  skos:notation "a87b3af2"^^agrovoc:AgrovocCode ;
  skosxl:literalForm "Microscopía electrónica de barrido"@es .

agrovoc:xl_en_a12e2486
  a skosxl:Label ;
  dc:created "2023-04-27T10:07:47"^^xsd:dateTime ;
  void:inDataset <http://aims.fao.org/aos/agrovoc/void.ttl#Agrovoc> ;
  skos:notation "a87b3af2"^^agrovoc:AgrovocCode ;
  skosxl:literalForm "scanning electron microscopy"@en .

<http://agrotermos.dados.embrapa.br/agrotermos>
  a owl:owOntology, skos:ConceptScheme ;
  skos:prefLabel "Agrotermos"@es, "Agrotermos"@en, "Agrotermos"@pt-BR .

skos:prefLabel rdfs:comment "A resource has no more than one value of skos:prefLabel per language tag."@en .
agrovoc:c_a87b3af2
  a skos:Concept ;
  dc:created "2023-04-27T10:07:47"^^xsd:dateTime ;
  dc:modified "2025-09-08T04:04:12"^^xsd:dateTime ;
  void:inDataset <http://aims.fao.org/aos/agrovoc/void.ttl#Agrovoc> ;
  skos:broader agrovoc:c_28462 ;
  skos:definition agrovoc:xDef_a74fa002 ;
  skos:inScheme <http://agrotermos.dados.embrapa.br/agrotermos> ;
  skos:prefLabel "microscopie électronique à balayage"@fr, "Microscopía electrónica de barrido"@es, "scanning electron microscopy"@en ;
  skosxl:prefLabel agrovoc:xl_fr_88b46128, agrovoc:xl_es_c86b7a10, agrovoc:xl_en_a12e2486 .

agrovoc:c_28462
  a skos:Concept ;
  skos:narrower agrovoc:c_a87b3af2 ;
  skos:prefLabel "microscopia de varrimento"@pt, "microscopie à balayage"@fr, "scanning microscopy"@en, "Microscopia de barrido"@es .