@prefix agrovoc: <http://aims.fao.org/aos/agrovoc/> .
@prefix rdf: <http://www.w3.org/1999/02/22-rdf-syntax-ns#> .
@prefix ns0: <http://art.uniroma2.it/ontologies/vocbench#> .
@prefix dc: <http://purl.org/dc/terms/> .
@prefix xsd: <http://www.w3.org/2001/XMLSchema#> .
@prefix skos: <http://www.w3.org/2004/02/skos/core#> .

agrovoc:xDef_a74fa002
  rdf:value "Scanning electron microscopy is a characterization technique that images and analyzes a specimen by scanning an accelerated electron beam, followed by selectively collecting and recording secondary electrons, back-scattered electrons, and other signals arising from the beam and specimen interactions."@en ;
  ns0:hasSource "Ni C. (2013) Scanning Electron Microscopy (SEM). In: Wang Q.J., Chung YW. (eds) Encyclopedia of Tribology. Springer, Boston, MA. https://doi.org/10.1007/978-0-387-92897-5_1217" ;
  dc:created "2023-04-27T10:10:01"^^xsd:dateTime .

agrovoc:c_a87b3af2 skos:definition agrovoc:xDef_a74fa002 .